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书籍 (16)
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1

Characterization and Metrology for ULSI Technology 2000: International Conference (AIP Conference Proceedings)

Characterization and Metrology for ULSI Technology 2000: International Conference (AIP Conference Proceedings)

American Inst. of Physics

David G. Seiler, Alain C. Diebold, Thomas J. Shaffner, Robert McDonald, W. Murray Bullis, Patrick J. Smith, Erik M. Secula

年:

2001

语言:

english

文件:

DJVU, 5.67 MB

0 / 0

english, 2001

2

Inorganic Ultraviolet Filters in Sunscreen Products

Inorganic Ultraviolet Filters in Sunscreen Products

Sujata K. Bhatia & Alain Diebold & Juejun Hu & Kannan M. Krishnan & Dario Narducci & Suprakas Sinha Ray & Gerhard Wilde & Nazia Hassan Kera & Sreejarani Kesavan Pillai

年:

2024

语言:

english

文件:

PDF, 2.79 MB

0 / 0

english, 2024

3

Carbon Nanostructured Materials

Carbon Nanostructured Materials

Sujata K. Bhatia, Alain Diebold, Juejun Hu, Kannan M. Krishnan, Dario Narducci, Suprakas Sinha Ray, Gerhard Wilde, Alexander Khovavko, Eugene Strativnov, Andrii Nebesnyi, Denis Filonenko, Olexiy Sviatenko, Angela Piatova, Maksym Barabash

年:

2024

语言:

english

文件:

PDF, 5.64 MB

0 / 5.0

english, 2024

4

Handbook of Silicon Semiconductor Metrology

Handbook of Silicon Semiconductor Metrology

Alain C. Diebold (ed.)

年:

2001

语言:

english

文件:

PDF, 12.94 MB

0 / 0

english, 2001

5

Optical and Electrical Properties of Nanoscale Materials

Optical and Electrical Properties of Nanoscale Materials

Alain Diebold, Tino Hofmann

年:

2022

语言:

english

文件:

PDF, 15.45 MB

0 / 5.0

english, 2022

6

Handbook of Silicon Semiconductor Metrology

Handbook of Silicon Semiconductor Metrology

Alain C. Diebold (Editor)

年:

2001

语言:

english

文件:

PDF, 17.94 MB

0 / 0

english, 2001

7

Optical And Electrical Properties Of Nanoscale Materials

Optical And Electrical Properties Of Nanoscale Materials

Alain Diebold Tino Hofmann

年:

2022

语言:

english

文件:

PDF, 15.44 MB

0 / 0

english, 2022

8

Handbook of Sensor Networks: Compact Wireless and Wired Sensing Systems

Handbook of Sensor Networks: Compact Wireless and Wired Sensing Systems

Alain C. Diebold

年:

2004

语言:

english

文件:

PDF, 23.56 MB

0 / 0

english, 2004

9

Handbook of Silicon Semiconductor Metrology

Handbook of Silicon Semiconductor Metrology

Alain C Diebold, Ed.

年:

2007

语言:

spanish

文件:

PDF, 12.94 MB

0 / 0

spanish, 2007

10

Optical and Electrical Properties of Nanoscale Materials

Optical and Electrical Properties of Nanoscale Materials

Alain Diebold, Tino Hofmann

年:

2022

语言:

english

文件:

EPUB, 7.63 MB

0 / 0

english, 2022

11

Handbook of Silicon Semiconductor Metrology

Handbook of Silicon Semiconductor Metrology

Alain C Diebold, Ed.

年:

2001

语言:

english

文件:

LIT , 7.61 MB

0 / 0

english, 2001

12

Handbook of Silicon Semiconductor Metrology

Handbook of Silicon Semiconductor Metrology

Alain C Diebold, Ed.

年:

2007

语言:

spanish

文件:

EPUB, 7.42 MB

0 / 0

spanish, 2007

13

Handbook of Silicon Semiconductor Metrology

Handbook of Silicon Semiconductor Metrology

Alain C Diebold, Ed.

年:

2007

语言:

spanish

文件:

FB2 , 11.36 MB

0 / 0

spanish, 2007

14

Handbook of Silicon Semiconductor Metrology

Handbook of Silicon Semiconductor Metrology

Ed. Alain C Diebold

年:

2007

语言:

spanish

文件:

AZW3 , 8.27 MB

0 / 0

spanish, 2007

15

Handbook of Silicon Semiconductor Metrology

Handbook of Silicon Semiconductor Metrology

Ed. Alain C Diebold

年:

2007

语言:

spanish

文件:

MOBI , 19.70 MB

0 / 0

spanish, 2007

16

Optical and Electrical Properties of Nanoscale Materials

Optical and Electrical Properties of Nanoscale Materials

Alain Diebold, Tino Hofmann

年:

2022

语言:

english

文件:

AZW3 , 11.05 MB

0 / 0

english, 2022